GEKA is recognized for its innovative non-destructive metrologies for semiconductor process monitoring. We have kept pace with a rapidly evolving industry, expanding our capabilities and meeting the growing requirements of customers. Metrology tools introduced by GEKA founded companies are used to measure surface and bulk contamination and defects. Our tools are used to monitor a wide range of advanced processes, including furnace operations, wafer cleaning, epi, and ion-implantation. 

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