GEKA ASSOCIATES, with a proven track record in introducing breakthrough equipment for the microelectronics industry is seeking a partnership with an industrial entity interested in the productization and commercialization of two on-line process control modules based on the commercially proven technologies currently used in off-line process monitoring requiring monitor wafers:

  • A patented RF-based, non-contact electrical measurement system referred to as Defect Specific Lifetime Analyzer (DSLA) for on-line monitoring of semiconductor surface and bulk defects in microelectronic and wide bandgap semiconductor device manufacturing.

  • A proprietary photo-thermal surface cleaning on-line module for elipsometry and other applications identified by device manufacturers including a pre-clean treatment for gate oxidation, silicon epitaxy, and wafer bonding processes.

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For more information contact: info@gekallc.com