Technology
Inductive Detection of X-Ray Radiation
Inductive radiation sensing technology based on a low-cost non-crystalline material offers a substantial increase of energy resolution and sensitivity as compared to conventional, photo-conductive detectors based on the crystalline materials. A preliminary evaluation performed using a high defect density segment of a CZT wafer indicated that sensitivity of the inductive radiation sensors based on the non-crystalline materials will increase by at least one order of magnitude as compared to sensors based the crystalline materials. It is projected that additionally to higher energy resolution, higher sensitivity and decreased cost of imaging detectors, use of non-crystalline materials would also offer greater flexibility in the construction of x-ray and gamma-ray imaging detectors, an improvement of their spatial resolution and detector size. Energy Resolution in commonly used photo-conductive radiation detectors (pcRD) the radiation produced charge carriers are collected at the electrodes at preset time intervals. Therefore, delays in the charge collection time due to carrier mobility and charge trapping at crystal defects affect height of the peaks and reduce energy resolution of detectors. Unlike pcRD detectors, detectors based on the inductive radiation (iRD) technology are sensing X-rays produced charges at the location where they are created in the sensor bulk with signal propagating at the speed of light and therefore not limited by the carrier mobility and charge trapping.
Patents: US 10,018,738 B2, US 10,338,237 B2